Einladung zum Vortrag im Kolloquium Technische Kybernetik

  Sampled-Data Control with Uncertain Sampling Interval

Prof. Yasuaki Oishi
Nanzan University
Japan

Monday, 19. July 2010, 2:00 p.m.
IST-Seminar-Room 3.243 · Pfaffenwaldring 9 · Campus Stuttgart-Vaihingen

Abstract

A sampled-data control system is a practically important system, where a continuous-time plant is controlled by a discrete-time controller. Conventionally, the action of the discrete-time controller has been assumed uniform in time for convenience of its analysis and design. However, in networked control and embedded control, which gain importance recently, such uniform sampling is not expected.

In this talk, analysis and design of a sampled-data control system are considered with uncertain and time-varying sampling interval. In particular, the problem is described in a robust linear matrix inequality, which is a parameter-dependent linear matrix inequality to be satisfied for all possible parameter values. Although the robust linear matrix inequality is intractable directly, a tractable sufficient condition can be obtained with the mean-value theorem and the S-procedure. Conservatism of the approach can be reduced to any degree. This is a joint work with Hisaya Fujioka.

Biographical Information

Yasuaki Oishi received his Bachelor, Master, and Doctor of Engineering degrees from the University of Tokyo, Japan, in 1990, 1993, and 1998, respectively. From 1995 to 2007, he was with the Department of Mathematical Engineering and Information Physics, the University of Tokyo, as a Research Associate and an Assistant Professor. In 2007, he joined Nanzan University, Japan, as an Associate Professor, and he is currently a Professor within the Department of Systems Design and Engineering. From March 2010, he stays at the Laboratory for Analysis and Architecture of Systems (LAAS), France, for a one-year sabbatical. His research interests include robust control, sampled-data control, and a mathematical programming approach. He is a member of SICE, ISCIE, and IEEE.